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A study of thickness dependence on omnidirectional anti-reflection SiO 2 nanorod array fabricated by oblique angle deposition
Boonpichayapha, T., Plirdpring, T., Samransuksamer, B., Lertvanithpol, T., Chaikeeree, T., Chananonawathorn, C., Pattantsetakul, V., Horprathum, M., Limwichean, S., Nuntawong, N., Eiamchai, P.Volume:
4
Year:
2017
Language:
english
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2017.06.091
File:
PDF, 624 KB
english, 2017