Laser Ultrasonic Thin Film Characterization of Si-Cu-Al-Cu Multi-Layered Stacks
Grünwald, Eva, Nuster, Robert, Paltauf, Günther, Maier, Thomas, Wimmer-Teubenbacher, Robert, Konetschnik, Ruth, Kiener, Daniel, Leitgeb, Verena, Köck, Anton, Brunner, RolandVolume:
4
Year:
2017
Language:
english
Journal:
Materials Today: Proceedings
DOI:
10.1016/j.matpr.2017.08.006
File:
PDF, 6.77 MB
english, 2017