Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2017 / 11 Vol. 35; Iss. 6
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Thermal stability and small-signal characteristics of AlGaN/GaN HEMTs with gate insertion metal layer for millimeter-wave applications
Kim, Dong-Hwan, Eom, Su-Keun, Jeong, Jun-Seok, Lee, Jae-Gil, Seo, Kwang-Seok, Cha, Ho-YoungVolume:
35
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4998310
Date:
November, 2017
File:
PDF, 1.98 MB
english, 2017