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Stress-induced surface characterization by wavelet and fractal analysis in Ga-doped ZnO thin films
Jing, Chenlei, Hu, Yang, Tang, WuVolume:
2
Year:
2017
Language:
english
Journal:
MRS Advances
DOI:
10.1557/adv.2017.340
File:
PDF, 401 KB
english, 2017