Improved Spatial Resolution of EDX/SEM for the Elemental...

Microscopy and Microanalysis 2015 / 08 Vol. 21; Iss. S3

Improved Spatial Resolution of EDX/SEM for the Elemental Analysis of Nanoparticles

Mielke, Johannes, Rades, Steffi, Ortel, Erik, Salge, Tobias, Hodoroaba, Vasile-Dan
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Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927615009344
Date:
August, 2015
File:
PDF, 188 KB
english, 2015
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