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AIP Conference Proceedings [Author(s) PROSPECTS OF FUNDAMENTAL SCIENCES DEVELOPMENT (PFSD-2017): Proceedings of the XIV International Conference of Students and Young Scientists - Tomsk, Russia (25–28 April 2017)] - Durability evaluation method for contact component interconnections in printed circuit boards under thermal loads
Azin, Anton, Zhukov, Andrey A., Ponomarev, Sergey A., Ponomarev, Sergey V.Volume:
1899
Year:
2017
Language:
english
DOI:
10.1063/1.5009886
File:
PDF, 1.05 MB
english, 2017