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[ACM Press the 2017 ACM SIGMETRICS / International Conference - Urbana-Champaign, Illinois, USA (2017.06.05-2017.06.09)] Proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems - SIGMETRICS '17 Abstracts - Understanding Reduced-Voltage Operation in Modern DRAM Devices
Chang, Kevin K., Mutlu, Onur, Yaăhıkçı, Abdullah Giray, Ghose, Saugata, Agrawal, Aditya, Chatterjee, Niladrish, Kashyap, Abhijith, Lee, Donghyuk, O'Connor, Mike, Hassan, HasanYear:
2017
Language:
english
DOI:
10.1145/3078505.3078590
File:
PDF, 820 KB
english, 2017