Simultaneous High-Speed DualEELS and EDS acquisition at...

Microscopy and Microanalysis 2015 / 08 Vol. 21; Iss. S3

Simultaneous High-Speed DualEELS and EDS acquisition at atomic level across the LaFeO3 / SrTiO3 interface

Longo, P., Topuria, T., Rice, P., Aitouchen, A, Thomas, P.J., Twesten, R.D.
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Volume:
21
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927615010065
Date:
August, 2015
File:
PDF, 250 KB
english, 2015
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