[IEEE 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Thessaloniki, Greece (2017.7.3-2017.7.5)] 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS) - Reliability analysis of MTJ-based functional module for neuromorphic computing
Vatajelu, Elena Ioana, Anghel, LorenaYear:
2017
Language:
english
DOI:
10.1109/IOLTS.2017.8046207
File:
PDF, 256 KB
english, 2017