[IEEE 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - Strasbourg, France (2016.10.29-2016.11.6)] 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD) - MEBCIS: Multi-energy betatron-based cargo inspection system
Arodzero, Anatoli, Boucher, Salime, Kutsaev, Sergey V., Lanza, Richard C., Palermo, Vincent, O'Shea, Finn, Ziskin, VitaliyYear:
2016
Language:
english
DOI:
10.1109/NSSMIC.2016.8069705
File:
PDF, 1.89 MB
english, 2016