Characterization of total ionizing dose damage in COTS...

AIP Advances 2016 / 03 Vol. 6; Iss. 3

Characterization of total ionizing dose damage in COTS pinned photodiode CMOS image sensors

Wang, Zujun, Ma, Wuying, Huang, Shaoyan, Yao, Zhibin, Liu, Minbo, He, Baoping, Liu, Jing, Sheng, Jiangkun, Xue, Yuan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
6
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4943674
Date:
March, 2016
File:
PDF, 3.04 MB
english, 2016
Conversion to is in progress
Conversion to is failed