![](/img/cover-not-exists.png)
Accumulation of counterions and coions evaluated by cryogenic XPS as a new tool for describing the structure of electric double layer at the silica/water interface
Škvarla, Jiří, Kaňuchová, Mária, Shchukarev, Andrey, Brezáni, Ivan, Škvarla, JurajVolume:
19
Year:
2017
Language:
english
Journal:
Physical Chemistry Chemical Physics
DOI:
10.1039/C7CP06439J
File:
PDF, 1.71 MB
english, 2017