A numerical analysis and experimental demonstration of a low degradation conductive bridge resistive memory device
Berco, Dan, Chand, Umesh, Fariborzi, HosseinVolume:
122
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.5008727
Date:
October, 2017
File:
PDF, 5.63 MB
english, 2017