Determination of tolerance limits for the reliability of...

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Quality and Reliability Engineering International 2017 / 10

Determination of tolerance limits for the reliability of semiconductor devices using longitudinal data

Hofer, Vera, Leitner, Johannes, Lewitschnig, Horst, Nowak, Thomas
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Language:
english
Journal:
Quality and Reliability Engineering International
DOI:
10.1002/qre.2226
Date:
October, 2017
File:
PDF, 1.07 MB
english, 2017
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