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[IEEE 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS) - Boston, MA, USA (2017.8.6-2017.8.9)] 2017 IEEE 60th International Midwest Symposium on Circuits and Systems (MWSCAS) - Skin lesions classification based on color plane-histogram-image quality analysis features extracted from digital images
Rahman, M. A., Haque, M. T., Shahnaz, C., Fattah, S. A., Zhu, W. P., Ahmed, M. O.Year:
2017
Language:
english
DOI:
10.1109/MWSCAS.2017.8053183
File:
PDF, 3.08 MB
english, 2017