Robust electronic and mechanical properties to layer number...

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Robust electronic and mechanical properties to layer number in two-dimensional wide-gap X(OH)2 (X= Mg, Ca)

Xia, Congxin, Xiong, Wenqi, Du, Juan, Wang, Tianxing, Wei, Zhongming, Li, Jingbo
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Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/1361-6463/aa996e
Date:
November, 2017
File:
PDF, 1.36 MB
english, 2017
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