Prognostics of aluminum electrolytic capacitors using...

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Microelectronics Reliability 2017 / 11

Prognostics of aluminum electrolytic capacitors using artificial neural network approach

Khera, Neeraj, Khan, Shakeb A.
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Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2017.11.002
Date:
November, 2017
File:
PDF, 1.34 MB
english, 2017
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