Fundraising September 15, 2024 – October 1, 2024 About fundraising

Characterization of the sub-micrometer hierarchy levels in...

  • Main
  • 2017 / 11
  • Characterization of the sub-micrometer hierarchy levels in...

Characterization of the sub-micrometer hierarchy levels in the twist-bend nematic phase with nanometric helices via photopolymerization. Explanation for the sign reversal in the polar response.

Panov, Vitaly P., Sreenilayam, Sithara P., Panarin, Yuri, Vij, Jagdish K., Welch, Chris, Mehl, Georg H.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Language:
english
Journal:
Nano Letters
DOI:
10.1021/acs.nanolett.7b03441
Date:
November, 2017
File:
PDF, 5.24 MB
english, 2017
Conversion to is in progress
Conversion to is failed