Characterization of the sub-micrometer hierarchy levels in the twist-bend nematic phase with nanometric helices via photopolymerization. Explanation for the sign reversal in the polar response.
Panov, Vitaly P., Sreenilayam, Sithara P., Panarin, Yuri, Vij, Jagdish K., Welch, Chris, Mehl, Georg H.Language:
english
Journal:
Nano Letters
DOI:
10.1021/acs.nanolett.7b03441
Date:
November, 2017
File:
PDF, 5.24 MB
english, 2017