Contamination-free Ge-based graphene as revealed by...

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Nanotechnology 2017 / 11

Contamination-free Ge-based graphene as revealed by Graphene Enhanced Secondary Ion Mass Spectrometry (GESIMS)

Michałowski, Paweł Piotr, Pasternak, Iwona, Strupiński, Włodzimierz
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Language:
english
Journal:
Nanotechnology
DOI:
10.1088/1361-6528/aa98ed
Date:
November, 2017
File:
PDF, 487 KB
english, 2017
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