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A capillary specimen aberration for describing X-ray powder diffraction line profiles for convergent, divergent and parallel beam geometries
Coelho, Alan A., Rowles, Matthew R.Volume:
50
Language:
english
Journal:
Journal of Applied Crystallography
DOI:
10.1107/S160057671701130X
Date:
October, 2017
File:
PDF, 1.86 MB
english, 2017