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Nature of carrier injection in metal/2D-semiconductor interface and its implications for the limits of contact resistance
Somvanshi, Divya, Kallatt, Sangeeth, Venkatesh, Chenniappan, Nair, Smitha, Gupta, Garima, Anthony, John Kiran, Karmakar, Debjani, Majumdar, KausikVolume:
96
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.96.205423
Date:
November, 2017
File:
PDF, 5.74 MB
english, 2017