Investigation of the features of integrating nonvolatile...

Russian Microelectronics 2017 / 9 Vol. 46; Iss. 5

Investigation of the features of integrating nonvolatile FRAM elements with CMOS technology

Orlov, O. M., Voronov, D. D., Izmailov, R. A., Krasnikov, G. Ya.
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Volume:
46
Language:
english
Journal:
Russian Microelectronics
DOI:
10.1134/s1063739717050067
Date:
September, 2017
File:
PDF, 556 KB
english, 2017
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