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A novel MRTD model for signal integrity analysis of resistive driven coupled copper interconnects
Rebelli, Shashank, Nistala, Bheema Rao, Sykulski, JanLanguage:
english
Journal:
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering
DOI:
10.1108/COMPEL-12-2016-0521
Date:
November, 2017
File:
PDF, 532 KB
english, 2017