Characterization of High-Quality Kerfless Epitaxial Silicon...

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Characterization of High-Quality Kerfless Epitaxial Silicon for Solar Cells: Defect Sources and Impact on Minority-Carrier Lifetime

Kivambe, Maulid M., Powell, Douglas M., Castellanos, Sergio, Jensen, Mallory Ann, Morishige, Ashley E., Lai, Barry, Hao, Ruiying, Ravi, T.S., Buonassisi, Tonio
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Language:
english
Journal:
Journal of Crystal Growth
DOI:
10.1016/j.jcrysgro.2017.11.016
Date:
November, 2017
File:
PDF, 1.42 MB
english, 2017
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