Leakage Characterization of Top Select Transistor for...

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Solid-State Electronics 2017 / 11

Leakage Characterization of Top Select Transistor for Program Disturbance Optimization in 3D NAND Flash

Zhang, Yu, Jin, Lei, Jiang, Dandan, Zou, Xingqi, Zhao, Zhiguo, Gao, Jing, Zeng, Ming, Zhou, Wenbin, Tang, Zhaoyun, Huo, Zongliang
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Language:
english
Journal:
Solid-State Electronics
DOI:
10.1016/j.sse.2017.11.006
Date:
November, 2017
File:
PDF, 923 KB
english, 2017
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