![](/img/cover-not-exists.png)
Probing the surface charge on the basal planes of Kaolinite particles with high resolution Atomic Force Microscopy
Kumar, Naveen, Andersson, Martin Peter, van den Ende, Dirk, Mugele, Frieder, Siretanu, IgorLanguage:
english
Journal:
Langmuir
DOI:
10.1021/acs.langmuir.7b03153
Date:
November, 2017
File:
PDF, 1.62 MB
english, 2017