[ACM Press the 50th Annual IEEE/ACM International Symposium...

  • Main
  • [ACM Press the 50th Annual IEEE/ACM...

[ACM Press the 50th Annual IEEE/ACM International Symposium - Cambridge, Massachusetts (2017.10.14-2017.10.18)] Proceedings of the 50th Annual IEEE/ACM International Symposium on Microarchitecture - MICRO-50 '17 - Detecting and mitigating data-dependent DRAM failures by exploiting current memory content

Khan, Samira, Wilkerson, Chris, Wang, Zhe, Alameldeen, Alaa R., Lee, Donghyuk, Mutlu, Onur
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2017
Language:
english
DOI:
10.1145/3123939.3123945
File:
PDF, 1.33 MB
english, 2017
Conversion to is in progress
Conversion to is failed