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[ACM Press the 50th Annual IEEE/ACM International Symposium - Cambridge, Massachusetts (2017.10.14-2017.10.18)] Proceedings of the 50th Annual IEEE/ACM International Symposium on Microarchitecture - MICRO-50 '17 - Detecting and mitigating data-dependent DRAM failures by exploiting current memory content
Khan, Samira, Wilkerson, Chris, Wang, Zhe, Alameldeen, Alaa R., Lee, Donghyuk, Mutlu, OnurYear:
2017
Language:
english
DOI:
10.1145/3123939.3123945
File:
PDF, 1.33 MB
english, 2017