Low-energy ion scattering spectroscopy and reflection...

Japanese Journal of Applied Physics 2017 / 12 Vol. 56; Iss. 12

Low-energy ion scattering spectroscopy and reflection high-energy electron diffraction of native oxides on GaN(0001)

Irokawa, Yoshihiro, Suzuki, Taku T., Yuge, Kazuya, Ohi, Akihiko, Nabatame, Toshihide, Kimoto, Koji, Ohnishi, Tsuyoshi, Mitsuishi, Kazutaka, Koide, Yasuo
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Volume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.128004
Date:
December, 2017
File:
PDF, 519 KB
english, 2017
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