Spectral ellipsometry as a method for characterization of nanosized films with ferromagnetic layers
Hashim, H., Singkh, S. P., Panina, L. V., Pudonin, F. A., Sherstnev, I. A., Podgornaya, S. V., Shpetnyi, I. A., Beklemisheva, A. V.Volume:
59
Language:
english
Journal:
Physics of the Solid State
DOI:
10.1134/S1063783417110142
Date:
November, 2017
File:
PDF, 917 KB
english, 2017