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[IEEE 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Honolulu, HI, USA (2017.7.21-2017.7.26)] 2017 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) - Efficient Multiple Instance Metric Learning Using Weakly Supervised Data
Law, Marc T., Yu, Yaoliang, Urtasun, Raquel, Zemel, Richard S., Xing, Eric P.Year:
2017
Language:
english
DOI:
10.1109/CVPR.2017.630
File:
PDF, 329 KB
english, 2017