Microbeam Heavy Ion Single Event Effect on Xilinx 28 nm...

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IEEE Transactions on Nuclear Science 2017

Microbeam Heavy Ion Single Event Effect on Xilinx 28 nm System-on-Chip

Yang, Weitao, Du, Xuecheng, He, Chaohui, Shi, Shuting, Cai, Li, Hui, Ning, Guo, Gang, Huang, Chengliang
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2017.2776244
File:
PDF, 776 KB
english, 2017
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