On the limits of applicability of drift-diffusion based hot...

Japanese Journal of Applied Physics 2016 / 04 Vol. 55; Iss. 4S

On the limits of applicability of drift-diffusion based hot carrier degradation modeling

Jech, Markus, Sharma, Prateek, Tyaginov, Stanislav, Rudolf, Florian, Grasser, Tibor
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Volume:
55
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.55.04ED14
Date:
April, 2016
File:
PDF, 1.61 MB
english, 2016
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