Low-Frequency Noise in III–V Nanowire TFETs and MOSFETs
Hellenbrand, Markus, Memisevic, Elvedin, Berg, Martin, Kilpi, Olli-Pekka, Svensson, Johannes, Wernersson, Lars-ErikVolume:
38
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2017.2757538
Date:
November, 2017
File:
PDF, 557 KB
english, 2017