[IEEE 2017 IEEE 18th Workshop on Control and Modeling for Power Electronics (COMPEL) - Stanford, CA, USA (2017.7.9-2017.7.12)] 2017 IEEE 18th Workshop on Control and Modeling for Power Electronics (COMPEL) - Modelling and quantification of power losses due to dynamic on-state resistance of GaN E-mode HEMT
Spro, Ole Christian, Peftitsis, Dimosthenis, Midtgard, Ole-Morten, Undeland, ToreYear:
2017
Language:
english
DOI:
10.1109/compel.2017.8013410
File:
PDF, 643 KB
english, 2017