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Design, Yield and Process Capability Study of 8 kV 4H-SiC PIN Diodes
Bolotnikov, Alex V., Losee, Peter A., Matocha, Kevin, Nasadoski, Jeff, Glaser, John, Arthur, Stephen, Stum, Z., Garrett, J., Elasser, Ahmed, Stevanovic, Ljubisa, Naik, Harsh, Chow, T. PaulVolume:
717-720
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.717-720.953
Date:
May, 2012
File:
PDF, 467 KB
english, 2012