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In operando x-ray imaging of nanoscale devices: Composition, valence, and internal electrical fields
Johannes, Andreas, Salomon, Damien, Martinez-Criado, Gema, Glaser, Markus, Lugstein, Alois, Ronning, CarstenVolume:
3
Language:
english
Journal:
Science Advances
DOI:
10.1126/sciadv.aao4044
Date:
December, 2017
File:
PDF, 676 KB
english, 2017