Electrical performance and stability of Tungsten Indium Zinc Oxide Thin-Film Transistors
Chauhan, Ram Narayan, Tiwari, Nidhi, Shieh, Han-Ping D., Liu, Po-TsunLanguage:
english
Journal:
Materials Letters
DOI:
10.1016/j.matlet.2017.12.020
Date:
December, 2017
File:
PDF, 998 KB
english, 2017