Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer
Gu, Honggang, Chen, Xiuguo, Zhang, Chuanwei, Jiang, Hao, Liu, ShiyuanVolume:
20
Language:
english
Journal:
Journal of Optics
DOI:
10.1088/2040-8986/aa9b05
Date:
January, 2018
File:
PDF, 3.61 MB
english, 2018