Carrier Trapping by Oxygen Impurities in Molybdenum...

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ACS Applied Materials & Interfaces 2017 / 12

Carrier Trapping by Oxygen Impurities in Molybdenum Diselenide

Chen, Ke, Roy, Anupam, Rai, Amritesh, Valsaraj, Amithraj, Meng, Xianghai, He, Feng, Xu, Xiaochuan, Register, Leonard Frank, Banerjee, Sanjay K., Wang, Yaguo
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Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.7b15478
Date:
December, 2017
File:
PDF, 1.21 MB
english, 2017
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