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Photo-induced strain imaging of semiconductors
Takata, Keiji, Nakasuji, Sho, Nishino, Takao, Osaka, Ryuma, Matsushita, YukiVolume:
7
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4979922
Date:
April, 2017
File:
PDF, 16.11 MB
english, 2017