CMOS-sensors for energy-resolved X-ray imaging

Journal of Instrumentation 2016 / 01 Vol. 11; Iss. 1

CMOS-sensors for energy-resolved X-ray imaging

Doering, D., Amar-Youcef, S., Baudot, J., Deveaux, M., Dulinski, W., Kachel, M., Linnik, B., Müntz, C., Stroth, Joachim
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Volume:
11
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/11/01/C01013
Date:
January, 2016
File:
PDF, 500 KB
english, 2016
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