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[IEEE 2017 IEEE/MTT-S International Microwave Symposium - IMS 2017 - Honololu, HI, USA (2017.6.4-2017.6.9)] 2017 IEEE MTT-S International Microwave Symposium (IMS) - A 70–110 GHz single-chip SiGe reflectometer with integrated local oscillator quadrupler
Ku, Bon-Hyun, Chung, Hyunchul, Rebeiz, Gabriel M.Year:
2017
Language:
english
DOI:
10.1109/MWSYM.2017.8058753
File:
PDF, 175 KB
english, 2017