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Hole Trapping Phenomenon at the Grain Boundary of Thin Poly-Si Floating-Body MOSFET and Its Capacitor-Less DRAM Application
Baek, Myung-Hyun, Lee, Sang-Ho, Kwon, Dae Woong, Seo, Joo Yun, Park, Byung-GookVolume:
17
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2017.14027
Date:
May, 2017
File:
PDF, 6.70 MB
english, 2017