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Role of the Electrode Material on the RESET Limitation in Oxide ReRAM Devices
Schönhals, Alexander, Rosário, Carlos M. M., Hoffmann-Eifert, Susanne, Waser, Rainer, Menzel, Stephan, Wouters, Dirk J.Language:
english
Journal:
Advanced Electronic Materials
DOI:
10.1002/aelm.201700243
Date:
December, 2017
File:
PDF, 2.14 MB
english, 2017