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Standard Bundles Simplify Standards-based Quantification in NIST DTSA-II
Ritchie, Nicholas W. M., Mengason, Michael J., Newbury, Dale E.Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617001787
Date:
July, 2017
File:
PDF, 264 KB
english, 2017