tomviz: Providing Advanced Electron Tomography by...

Microscopy and Microanalysis 2017 / 07 Vol. 23; Iss. S1

tomviz: Providing Advanced Electron Tomography by Streamlining Alignment, Reconstruction, and 3D Visualization

Jiang, Yi, Padgett, Elliot, Hanwell, Marcus D., Quammen, Cory, Harris, Chris, Waldon, Shawn, Muller, David A., Hovden, Robert
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Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617001799
Date:
July, 2017
File:
PDF, 3.91 MB
english, 2017
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