Quantification of Low Voltage Images of 2-dimensional...

Microscopy and Microanalysis 2017 / 07 Vol. 23; Iss. S1

Quantification of Low Voltage Images of 2-dimensional Materials in Aberration Corrected Scanning Transmission Electron Microscopy.

Oxley, Mark P., Cross, Nicholas G., Duscher, Gerd, Allen, Leslie J., Chisholm, Matthew F.
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Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617003002
Date:
July, 2017
File:
PDF, 484 KB
english, 2017
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