Electron Beam Sources using InGaN Semiconductor...

Microscopy and Microanalysis 2017 / 07 Vol. 23; Iss. S1

Electron Beam Sources using InGaN Semiconductor Photocathodes for Single-shot Imaging Electron Microscope

Nishitani, Tomohiro, Narita, Akihiro, Tomita, Takeshi, Kitamura, Shin-ichi, Meguro, Takashi, Iijima, Hokuto, Fuchi, Shingo, Tabuchi, Masao, Honda, Yoshio, Amano, Hiroshi
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Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617004706
Date:
July, 2017
File:
PDF, 5.47 MB
english, 2017
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