Going Deeper in Cryo Electron Tomography with Neural...

Microscopy and Microanalysis 2017 / 07 Vol. 23; Iss. S1

Going Deeper in Cryo Electron Tomography with Neural Networks

Chen, Muyuan, Dai, Wei, Sun, Stella Y., Schmid, Michael F., Chiu, Wah, Ludtke, Steven J.
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Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617004731
Date:
July, 2017
File:
PDF, 488 KB
english, 2017
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