Integrated Microscopy: Highly Accurate Light-Electron Image Correlation Anywhere on a Sample
Haring, M.T., Liv, N., Zonnevylle, A.C., Narvaez, A.C., Kruit, P., Hoogenboom, J.P., Voortman, L.M.Volume:
23
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927617007024
Date:
July, 2017
File:
PDF, 172 KB
english, 2017